商品介紹

時間解析光(電)激發光量測系統

Time-resolved EL/PL (TREL/TRPL) Measurement System



 

 

Introduction:
   The temporal response of optical material or device system is of great interest for fundamental study and physical property identification. Minority carrier lifetime can be obtained by TREL or TRPL for device or material, respectively. The influence of surface or interface can also be extracted. Further modulation in band structure of tested device is used to investigate the carrier transportation mechanism.

  


 The range of time scale for TREL/TRPL measurement is determined by device or material properties. The optical transition mechanism, defects, carrier transportation mechanism, and so on, will contributed to the transient response and perform different behavior with time.

 The time scale of TREL/TRPL ranges from ~fs to ~s and the the system setup is different accordingly.